Microwave and RF

In Your Own Words with Peter Ladbrooke

With the recent release Nonlinear Design: FETs and HEMTs, we spoke to Peter Ladbrooke to find out the motivation behind his new book with Artech House. “Nonlinear Design, FETs and HEMTs is a detailed account of how the standard non-linear circuit model of these devices can be reformed to extend its range of validity and …

Problem Solving 101 with Matteo Pastorino – Innovations in Microwave Imaging Techniques

“There are many good specialized books about various aspects of microwave imaging, but Pastorino and Randazzo believed that an overview of methods and applications could stimulate readers along different directions – novel applications perhaps, or improving the technology in some manner. They cover basic concepts of microwave imaging systems and the electromagnetic characterization of materials, fundamentals …

About the Physical Relevance of Optimizer-Based Extracted Model Elements with Gunter Kompa

Commonly small-signal model parameter extraction of microwave devices with a higher degree of complexity relies on optimization. This is outlined in more detail in my book Parameter Extraction and Complex Nonlinear Transistor Models. There are numerous optimization methods proposed in the literature. Based on a physical device model with a defined number of model elements …

Microwave and Millimeter-Wave Vacuum Electron Devices with A.S. Gilmour, Jr.

Gilmour Brochure Written by an internationally recognized as an expert on the subject of microwave (MW) tubes, this book presents and describes the many types of microwave tubes, and despite competition from solid-state devices (those using GaN, SiC, et cetera), which continue to be used widely and find new applications in defense, communications, medical, and …

RF and Optical Device Integration with Geoff Varrall

RF and Optical Device Integration There are some things that are obvious to say but are still worth saying and the same principle applies to technical writing; however much the reader knows and understands, every story has to have a starting point. That starting point is often some combination of material and manufacturing innovation that …

Set the Appropriate Measuring Range for Consistent Model Parameter Extraction with Gunter Kompa

Measuring the scattering parameters of a microwave transistor to develop an appropriate small-signal device model, the question may come up about the minimum frequency range needed to extract reliable  model parameter values. This issue has been studied intensively for microwave devices based on GaN technology and discussed in detail in my book Parameter Extraction and …

Getting Broad and Thorough Understanding in the Field of Device Modeling and Model Parameter Extraction with Gunter Kompa

My published book titled Parameter Extraction and Complex Nonlinear Transistor Models concerns with the following three key topics: Small-signal model parameter extraction Large-signal device modeling Large-signal measurement techniques In my first post, dated December 17, 2019, I explained the limitation of using the standard 15-element FET model for modern high power multifinger GaN devices. Similar …