When Artech House authors write their books, we ask them what they want their readers to get out of the project. In this series, we show you what our authors, in their own words, wish to impart upon readers. Take a look at what authors of High-Power Electromagnetic Effects on Electronic Systems, D.V. Giri, Richard Hoad and Frank Sabath had to say:
In present day society, we are increasing our reliance on widespread technological advancements which are largely underpinned by semiconductor based electronic systems. The diverse infrastructure requirements of our society such as; Electricity, gas and water management; communications; local and national government, civil defense, emergency response, transportation (including air traffic management), law-enforcement, healthcare and commerce (both internet and otherwise), have become more dependent on these advancements in electronics-based technologies. However, with technological sophistication new risks to the functional reliability and even safety of the electronics-based technologies are bound to emerge. One such risk factor described in detail in this book is that of High Power Electromagnetic (HPEM) phenomena which encompasses a wide variety of phenomena both natural and man-made in origin. Natural lightning happens to be the only phenomena made by nature, the others, such as Nuclear Electromagnetic Pulse (NEMP) and High-Power Radio Frequency (HPRF) phenomena including RF broadcast, Radar and Directed Energy and Intentional Electromagnetic Interference (IEMI) are all made by humankind.
The effect or impact of an incident HPEM environment on an electronics system victim may be characterized as natural, accidental or intentional. When such environments are created with a purpose of deliberately and maliciously causing denial, disruption or damage of electronic systems, they may be classified as Directed Energy systems or IEMI sources. These phenomena can affect military assets, as well as civilian infrastructure.
The denial, disruptive and damaging effects of such HPEM phenomena have been systematically studied by many researchers. Characterization and quantification of the HPEM induced effects comes from an understanding of the coupling and interaction between the HPEM environments and the system. Once the effects are understood, the goal then becomes one of achieving ElectroMagnetic Compatibility or EMC, resulting in a resilient system.
In this book we describe some examples of the generation of HPEM environments such as narrowband HPM, moderate band damped sinusoidal radiators and hyperband radiating systems. We then focus on HPEM effects at many levels of electronics, such as component, circuit, sub-system and system level drawing a great deal on the large volume of published work and drawing conclusions where possible. We will show that the function of the victim of HPEM disturbance has a profound impact on the severity of the effect. We will provide some insight on HPEM effects experimental techniques and the standards which can be used to control tests. We will discuss the validity of analytical techniques and computational modeling in a HPEM effects context.
The main objective of this book is to provide a reference text to the reader, which dispels myths, clarifies good experimental practice and ultimately draws conclusions on the HPEM interaction with electronics. It is hoped that this book will encourage the reader to consider the importance of HPEM phenomena as a threat to modern electronic based technologies which underpin society and to therefore be pre-emptive in the consideration of HPEM resilience.
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